Identifying defects

Inspectis launches overlay assisted inspection concept

Inspectis overlay assisted inspection concept
The Overlay Assisted Inspection system overlays a live image on a reference picture, in order to identify defects. Source: Inspectis AB

The fastest and most accurate technique for the human eye and mind to detect defects is through visual comparison of graphic images. Defects that otherwise might be overlooked become immediately apparent, which is why Inspectis AB has developed the concept of Overlay Assisted Inspection, or OAI, for its advanced digital camera inspection systems.

The Inspectis OAI (easily remembered due to its similarity to AOI) leverages the company’s recently released more powerful software package version 5.0 incorporating the overlay software feature. This feature uses ‘Compare Windows’, for example, where the operator can compare a live image to a reference picture or compare 2–4 still images to each other.

With the Overlay Assisted Inspection, a live image can be overlaid on a reference picture with timer-controlled interval display. It’s an efficient tool for identifying missing components, wrong polarity, misplacements and other defects on assembled PCBs. Overlay features include a built-in DXF creator and an editor for producing scaled overlay graticules. The user can create a DXF file from an object by optical edge detection, plus edit, draw patterns, shapes, add text and overlay on a live image. Save in DXF or PNG format and display as a digital graticule on the live image.

Inspectis’ OAI package includes a dedicated stand for quick precision alignment of boards. It’s a simple and efficient system that can be used with their FHD or UHD (4K) microscopes for the full range of magnification possibilities.

The OAI package was a popular visit at the recent productronica show and will be on display at the upcoming IPC Apex 2020.

Apex, Booth 3431

Company contact

Inspectis AB
Gelbgjutarevägen 5
171 48 Solna, Schweden
Tel.: +46 8–270 191

Also of interest:

Full range of inspection with HD microscope package


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