The version 2.3 of the enhanced generic test software library (EGTSL) for in-circuit tests provides a previously unavailable level of openness. It let users expand the test solution at any time by adding further test methods for new components. An automatic test generator and the intuitive graphical user interface enable you to implement error-free in-circuit test applications quickly without requiring much previous experience. The CompactPCI/PXI-based test platform thus makes it possible to perform configuration and function tests of electronic modules on one system.
The flexibility of the R&S CompactTSVP system platform in function tests is now also available for the in-circuit test. The R&S TS-PSAM module makes it possible to discharge electronic modules. Furthermore, you can perform contact, short-circuit and continuity tests as well as two- and four-pole resistor measurements. To integrate the entire in-circuit test function into the test platform, you need the In-Circuit Test (ICT) Extension Module R&S TS-PICT and the Power Supply Module R&S TS-PSU. The number of available test points can be selected in steps of 90.
The ICT program is generated by the automatic test generator (ATG), which calculates test suggestions for the relevant modules in XML format from the CAD data. The ATG automatically selects the relevant test and guard points and generates a wiring list. The intuitive, graphical debug user interface of R&S EGTSL allows you to optimize the ICT program highly efficiently. Knowledge of a special programming language or syntax is not necessary. The generated ICT program can be integrated into function test programs by means of a few function calls of the EGTSL Runtime Library.
EPP EUROPE 447
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