atg Luther & Maelzer showed the new A7–16 flying probe test solution for oversized boards, as well as, the high speed substrate test solution, S3–8.
The A7–16 test system is the optimum solution for high speed and high throughput testing of back panel and server boards. The A7–16 can be configured with 16 to 24 test heads and up to 12 cameras for optical alignment. Depending on the number of test heads, the test area is 24” to 39.9” (610 mm x 1000 mm) or 27” to 59,2” (670 mm x 1500 mm). The system features the latest direct linear drive technology delivering high accuracy and fast test speed for large format boards. For flexible boards a tension option is available.
The S3–8 10 µm substrate tester meets the challenging requirements of high end substrate test, which include positioning accuracy and a high number of contact points, by applying the advanced flying probe technology of the company. With its double-sided, eight test heads architecture the S3–8 achieves a substantially higher speed. This high throughput capability enables testing of high quantities of substrate boards using flying probe test systems providing the customer with an economical test solution.
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