During Productronica 2011 Aster Technologies will be demonstrating the Design-To-Test features that have been added to the TestWay and TestWay Express, DfT and Test Coverage analysis tools. The company have now added the capability to speed up the post layout test development process by generating the test files for assembly, X-Ray, optical inspection, flying-probe, in-circuit and boundary-scan machines.
In a recent Airbus experiment the ability to automatically export the ICT design-to-test files and the models for hybrid, analog and digital devices including the disabling features, reduced the test program development time by up to 30 %. In addition the company have embedded a test optimization algorithm within the Takaya flying probe test exporter that provides advanced test balancing and boundary-scan optimization. This can be either driven by the theoretical boundary-scan test coverage, or the real test coverage imported from Acculogic, Asset, Göpel electronic, Jtag Technologies and Xjtag testers. Additional exporters are currently under development to cover the test and inspection machines in the complete assembly line.
It is becoming increasingly im- portant to be able to organize test and assembly documents such as assembly and test instructions around CAD data, and provide a seamless transition between documents and board viewers. To this effect, the company has developed a QuadView portal that allows customers to organize their electronic documentation around the board viewer. By centralizing data through a user friendly interface, various document types such as PDF, HTML, TestWay reports etc, are all made available at the same time with cross probing between all the docu- ments and the QuadView schematic, layout and virtual schematic viewers.
All product properties become available on one screen such as RoHS status, product family and version etc. The portal also allows customers to organize documents by classifying them under tabs e.g. Assembly, Test, Control etc.
productronica, A1.232
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