Nikon Metrology, formerly known as Metris, has presented the compact yet versatile XT V 130 X-ray inspection system at the last Productronica. The system comes with a 30 to 130 kV open micro-focus X-ray source, a 4-axis programmable manipulator and a 16-bit imaging system based on a 4“ image intensifier. A focal spot size down to 3 micron, 320x geometric magnification and tilt angle up to 60° offer excellent image quality and sufficient flexibility. A rotate stage and CT capability are available as option. A hinged door provides easy access to the inspection area, which fits samples up to 40 x 35 cm (16 x 14“). The XT V 130 system is ideally suited to quickly trace material inconsistencies, connectivity issues, incomplete through-layer vias and other failures.
EPP EUROPE 543
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