The 4080 parametric test platform from Agilent Technologies has been designed to meet the evaluation needs of engineers working in semiconductor fabs and research environments. The 4080 series covers the full range of measurement requirements – from mainstream processes to advanced processes beyond 45 nm. The series is based on a platform featuring a faster CPU as well as asynchronous and synchronous parallel test capabilities that enable throughput improvement. The modular and expandable production test platform allows customers to easily add new testing capabilities, such as NAND/NOR flash memory cell characterization and RF S-parameter measurement. It is available in three models: the 4082A Parametric Test System for general purpose parametric test; the 4082F Flash Memory Cell Parametric Test System for NAND/NOR flash test; and the 4083A DC/RF Parametric Test System, to meet the high-frequency measurement requirements of modern RF devices. The 4080 Series has a more powerful CPU that boosts the throughput of transferred 4070 test plans by 10 to 20 percent on average without any program modification.
The Series running the company’s own SPECS (Semiconductor Process Evaluation Core Software) test shell is reportedly the first parametric tester to support both synchronous and asynchronous parallel test. In addition to synchronous parallel measurement the firm’s powerful and proprietary virtual multiple test head technology allows an advanced parallel test capability called “asynchronous parallel” to perform tests completely independently, which can decrease test times by up to 50 percent over conventional sequential test methods. The series is based on a unified architecture. All three models support two types of DC switching matrix cards: a standard low-current version and an ultra low-current version. The models also feature a high-speed capacitance measurement unit (HS-CMU) for making very fast capacitance measurements in the 1 kHz to 2 MHz range.
EPP Europe 457
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