Aeroflex has announced that a Dual Vacuum Control capability has been added to its 5220 Power Manufacturing Defects Analyser. This new capability allows dual well vacuum test fixtures to be directly controlled by the test system. Full backwards compatibility is maintained with existing test programs and fixtures.
Dual Well or ‘Chamber’ test fixtures can be used to maximize the throughput of a manually operated test system. The fixture is divided into two halves with each accepting one or more PCB’s. While one side of the fixture is testing a PCB, the other half of the fixture can be manually loaded or unloaded. This innovative capabi- lity increases the throughput of the test system by overlapping the test and load times.
Included with immediate effect as a standard feature on all new 5220 Power Manufacturing Defects Analysers, existing systems can be upgraded with the Dual Vacuum Control capability. A fast analog 19 inch rack-mountable test system, the analyser combines a high 1200 components/sec test speed with the ability to accurately test a wide range of component types, effectively blurring the line between MDA, or ana- log in-circuit, and full digital in-circuit. Controlled by an industry standard PC, the test system has a small footprint allowing simple integration into automated in-line manufacturing facilities.
electronica, booth A1.117
EPP EUROPE 443
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