SPEA and JTAG Technologies have integrated their test methods within the SPEA 3030 in-circuit test system. As a result, electronics designers and manufacturers will benefit from greater testability and programmability of complex PCBs, all within a single process step. The 3030 ‚polyfunctional‘ test system is a versatile and advanced board tester with comprehensive shorts/opens, analogue, power-up, digital, ‚vectorless‘, and AOI testing options. With integrated boundary-scan capabilities – powered by JTAG Technologies – users can now enhance their high-precision digital testing capabilities. Test development and deployment times are minimized, test coverage is maximized while fixture complexity can be reduced due to test-point elimination especially for complex digital PCBs where physical access to electrical nodes is limited. The tools also provide high throughput in-system programming using the DataBlaster family of controllers with clocking speeds of up to 40 MHz and support for NOR, NAND and serial flash parts as well as IEEE Std 1532 CPLD and legacy PLDs.
EPP Europe 434
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