Automated Accelerated Reliability Test Systems or AARTS is a high-tech system for testing, quality assurance and instrumentation in the professional electronics industry. AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. The AARTS version was developed to address the requirements of the large volume manufacturers for more test capacity, faster test-setup and configuration, dynamic stimulus paradigms for RF, DC and temperature, as well as embedded parametric characterization.
AARTS offers semiconductor manufacturers the flexibility to handle a wider breadth of test applications, a modular design approach that can be cost-effectively upgraded to meet projected technology roadmaps. AARTS is a turn-key product that allows engineering resources to focus on core-competencies.
AARTS were specifically designed for performing elevated temperature life-testing of advanced compound semiconductor devices. These systems measure, characterize, and record performance degradation and failure levels of RF devices. It works in order to demonstrate and predict meantime-to-failure (MTTF) and FIT-rate (component failure rate) probabilities at operating conditions.
EPP EUROPE 448
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