Karthik Vijay, Technical Manager, Europe, Africa, and the Middle East, Indium Corporation
It is critical that the no-clean flux residue does not cause ionic dendritic growth and corrosion under low-standoff power components during the working life of the product. For these reasons, the automotive industry is imposing more stringent Surface Insulation Resistance (SIR) requirements to assess the electrical reliability of the no-clean solder paste flux chemistry, versus the standard J- STD 004B IPC-SIR test requirements. These include increased test voltages, increased test time, reduced space width, upping the minimum SIR threshold, and usage of different test coupons.
Leakage current and failure of high-power Mosfet
In a study conducted by Indium Corporation, a power Mosfet low-standoff component was assembled with a no-clean solder paste and subjected to 50 V, 90 % RH for 1,000 hours. In this example, ionic dendritic growth was observed that resulted in leakage current and eventual failure of the assembly. This failure was specific only to the low-standoff Mosfet with no other component failures. With different test vehicles, the company was initiating an attempt to mimic the electrical failure of a no-clean paste for low-standoff components, with the intent to design an automotive-grade no-clean halogen-free solder paste for enhanced electrical reliability.
Design of automotive-grade no-clean halogen-free solder paste
No-clean flux characteristically consists of a mix of solvents, activators, resins, and rheological additives. During reflow, with normal volatilization, the activator-solvent system in “dry” flux residue is incapable of undergoing corrosion reaction when encapsulated by solid rosin in the presence of moisture, bias, and temperature. However, with lower standoffs preventing proper venting of flux volatiles, activator-solvent system in the “wet” flux residue are available for corrosion especially with moisture, bias, and temperature. The challenge is to design a flux system with the right rosin-activator-solvent complex that passes electrical reliability, regardless of whether the residue is “wet” or “dry.”
SIR testing with and without glass slide
A standard B24 SIR coupon was chosen for testing purposes. Five no-clean solder pastes consisting of four control pastes and the automotive-grade designed paste were tested as per J-STD 004B IPC SIR conditions. To evaluate the electrical performance of the no-clean pastes for low standoffs, a glass slide was placed on top of the printed flux deposits on one half of the B24 SIR coupon.





