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    Wide range of in-circuit,- functional and flying probe test
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    Products

    Wide range of in-circuit,- functional and flying probe test

    Once again, Seica has great news this year for visitors at Electronica. In fact, for the first time the complete Compact line of in-circuit and functional
    Veröffentlicht
    02. November 2012
    Lesezeit
    2 Minuten
    Rubrik
    Products

    In addition to the Compact line, the company will be showing the Pilot V8 flying prober, the ultimate in flying probe technology, equipped with 8 mobile probes on both sides, able to deploy 12 different test techniques, ranging from ICT to functional test, boundary scan, optical inspection and thermal scan of components, offering a complete platform for production testing, repair and reverse engineering of electronic boards. Its vertical architecture is the only one which enables true simultaneous, “double side” testing, reliably and accurately, and makes the Pilot V8 the only flying prober capable of doubling test throughput with respect to standard systems, testing 2 identical UUTs simultaneously with a single test program. The “automated” version of the Pilot V8 can operate in full operator-free mode, thanks to the loading/downloading module which is capable of handling up to 600 different board types.

    Electronica, booth A1.459

    www.seica.com

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