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    Startseite/Events-tutorials/Artikel
    Seica to exhibit time-saving flying probe test platform
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    Events-tutorials

    Seica to exhibit time-saving flying probe test platform

    Provider of flying probe test technology Seica will present its new Pilot VX platform at the IPC Apex Expo from 25–27 January in San Diego, California.
    Veröffentlicht
    18. Januar 2022
    Lesezeit
    1 Minute
    Rubrik
    Events-tutorials

    The company says the platform offers a reduction of up to 50% in test time due to its state-of-the-art mechanical performance and motion control. It also offers “12 multi-function test heads providing the capability to contact up to 44 points simultaneously, as well as advanced measurement hardware, new microwave-based measurement techniques and optimized VIVA software management which enables the parallelization of different types of tests.” The company adds that its smart analysis capabilities together with algorithms based on the principles of artificial intelligence can automatically optimize the test flow in run-time, while maintaining test coverage targets.

    “A vast selection of test performances means that the test process can be tailored to the specific requirements of the product being tested, whether it be a relatively simple bare printed circuit board, a complex wafer or PCB with passive and active embedded components,” the company said. “[Our] flying prober can test fully loaded double-side boards with components that also need to be programmed, LEDs to be tested electrically and optically, flex circuits, and very small and very large boards with very small and very large components.

    “In short, the Pilot VX is a flexible, configurable test system with an unrivaled set of technologically advanced tools, able to provide the test solutions required by the huge diversity which characterize today’s electronics.”

    www.seica.com

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