With SmartRA, V6000 WS users can easily add redundancy analysis capabilities for increased throughput and yield. As DRAM device densities continue to increase, so do the challenges of today’s wafer sort testing, requiring greater test parallelism, higher test frequencies and increased levels of complexity in device redundancy. These factors result in unprecedented volumes of data during redundancy analysis.
Consequently, the storage and performance required to capture fail data and effectively complete redundancy analysis are also reaching new levels. Verigy designed SmartRA to meet these requirements and because the solution utilizes high-performance blade servers, manufacturers can add processing power for redundancy analysis as they need it, without impacting the test cell footprint.
SmartRA is based on an open software architecture which makes it possible for customers to use Verigy-provided algorithms or develop their own for faster time to market and lower cost-of-test.
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