Acquiring accurate data in less time, the microscope incorporates a Peak algorithm for 3D data construction. This algorithm, combined with the intelligent Skip Scan function, has reduced data acquisition times by 75 %. Which makes it suited for high throughput applications, such as quality control in the automotive, electronic component and semiconductor industries. With the extension frame, samples of up to 210 mm can be analysed. Furthermore, with an ultra-long working distance objective, it is possible to measure dents of up to 25 mm and carry out comprehensive inspection of even the most challenging samples. The microscope is also equipped with 4K scanning technology that can capture steep slopes of up to 87.5°. The company has also designed dedicated objectives that perform uniform measurements across the entire field of view. Finally, a Smart Judge function was added that reliably distinguishes between steps on a sample and noise. These improvements make it possible to scan more different samples and improve confidence in the results.
The microscope comes with intuitive software with the ability to automate settings that previously had to be specified by the operator. The Smart Scan function and analysis templates automate the workflow from data acquisition to reporting, making it easy for anyone to operate the microscope simply by pushing the start button.
