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    PEMTRON showcases advanced inspection systems
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    Events-tutorials

    PEMTRON showcases advanced inspection systems

    Inspection equipment developer and supplier PEMTRON is excited to announce its participation at SEMICON Korea 2025. The trade fair is taking place from The JUPITER 3D X-ray Inspection System offers both 3D and 2D capabilities through advanced PCT reconstruction-based processing.
    Veröffentlicht
    23. Januar 2025
    Lesezeit
    2 Minuten
    Rubrik
    Events-tutorials

    JUPITER 3D X-ray Inspection System redefines precision

    The JUPITER 3D X-ray Inspection System offers both 3D and 2D capabilities through advanced PCT reconstruction-based processing. Equipped with a high-resolution optical camera and PEMTRON’s proven AOI defect detection algorithms, JUPITER provides manufacturers with an exceptional tool for comprehensive in-line inspection and process quality analysis. Its seamless integration with SPI and AOI systems enables data sharing, delivers valuable insights into the production process, and enhances overall efficiency. 

    MARS: High-speed memory module inspection

    The MARS system is PEMTRON’s high-speed automated visual inspection (AVI) solution for memory modules. Built for precision and reliability, MARS utilizes advanced image processing technology to deliver accurate inspection results, even in challenging environments. With its robust design and exceptional speed, MARS is an essential tool for manufacturers seeking to elevate quality control and production efficiency in memory module assembly. 

    APOLLON: Comprehensive package inspection

    APOLLON stands out among package inspection systems, owing to its ability to handle a wide range of packages, including BGA, LGA, QFN, QFP, CSP, and SOP. Designed for real-time defect detection and automated reporting, APOLLON enhances manufacturing efficiency by promptly identifying and addressing issues. This ensures consistent quality standards throughout the packaging process and minimizes downtime. 

    8800WI wafer inspection system: Advanced imaging for defect detection

    The 8800WI wafer inspection system incorporates state-of-the-art 2D and 3D imaging technologies to inspect various types of bumps, including micro bumps. Its advanced imaging capabilities enable the system to detect and address quality issues at an early stage of semiconductor manufacturing. The 8800WI ensures that even the smallest defects are identified and corrected, improving yield and product quality. 

    For more information about PEMTRON and its portfolio of inspection systems, visit www.pemtron.com. 

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