The Series running the company’s own SPECS (Semiconductor Process Evaluation Core Software) test shell is reportedly the first parametric tester to support both synchronous and asynchronous parallel test. In addition to synchronous parallel measurement the firm’s powerful and proprietary virtual multiple test head technology allows an advanced parallel test capability called “asynchronous parallel” to perform tests completely independently, which can decrease test times by up to 50 percent over conventional sequential test methods. The series is based on a unified architecture. All three models support two types of DC switching matrix cards: a standard low-current version and an ultra low-current version. The models also feature a high-speed capacitance measurement unit (HS-CMU) for making very fast capacitance measurements in the 1 kHz to 2 MHz range.
EPP Europe 457
