The semiconductor industry roadmap for optical transceivers calls for boosting speeds from today’s 40-Gbps interconnections to 100 Gbps by 2017 and possibly 400 Gbps by 2020. The new solution is among the first integrated solutions capable of cost-efficiently testing these high-speed devices.
By mounting the new module on the T2000 platform, this solution can simultaneously test up to eight 100-Gbps transceivers. To test each 100-Gbps transceiver, four lanes of both optical and electrical 28-Gbps ports are used. This integrated automated test equipment (ATE) solution enables faster cycle times and greater operating efficiency at a lower cost of test while also offering the benefit of being fully supported by Advantest’s global customer service network.
