New test methods

a test board for the test IC which provides a uniform interface between the test IC and test system
a CB 0708 connection board which is used to trigger the test IC
a GND25 ground plane which provides a uniform reference potential

The induced voltage affects the IC’s pin that is switched as the input. The disturbance voltage uSt is converted into a spurious signal in the IC by the input circuit and further processed as a logic signal.
The induced voltage drives a disturbance current iSt into the pins of the IC. This disturbance current enters the IC’s internal Vdd/Vss system directly if these are the Vdd/Vss pins. However, it can also enter via signal pins and be led to the Vdd/Vss system inside the IC via internal drivers or protective diodes or capacitances. The Vdd/Vss system passes the disturbance current on to other functional components of the IC so that malfunctions can arise in areas that are not functionally connected to the affected pins.

The network essentially has circuit elements R, L and diodes against Vdd and Vss on the board and in the IC. The displacement current generates a disturbance pulse uSt at these elements. This disturbance pulse is converted into a spurious signal in the IC by the input circuit and further processed as a logic signal.
The displacement current is split into two shares. The first share is discharged via the equivalent circuits of the board and any decoupling capacitors that may be present. The second share of the disturbance current iSt flows through the IC via drivers or protective diodes to the Vdd/Vss system. It produces effects similar to those of a magnetic field coupling.

a test board for the test IC which provides a uniform interface between the test IC and test system
a CB 0708 connection board which is used to trigger the test IC
a GND25 ground plane which provides a uniform reference potential

The induced voltage affects the IC’s pin that is switched as the input. The disturbance voltage uSt is converted into a spurious signal in the IC by the input circuit and further processed as a logic signal.
The induced voltage drives a disturbance current iSt into the pins of the IC. This disturbance current enters the IC’s internal Vdd/Vss system directly if these are the Vdd/Vss pins. However, it can also enter via signal pins and be led to the Vdd/Vss system inside the IC via internal drivers or protective diodes or capacitances. The Vdd/Vss system passes the disturbance current on to other functional components of the IC so that malfunctions can arise in areas that are not functionally connected to the affected pins.

The network essentially has circuit elements R, L and diodes against Vdd and Vss on the board and in the IC. The displacement current generates a disturbance pulse uSt at these elements. This disturbance pulse is converted into a spurious signal in the IC by the input circuit and further processed as a logic signal.
The displacement current is split into two shares. The first share is discharged via the equivalent circuits of the board and any decoupling capacitors that may be present. The second share of the disturbance current iSt flows through the IC via drivers or protective diodes to the Vdd/Vss system. It produces effects similar to those of a magnetic field coupling.

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