Dual Well or ‘Chamber’ test fixtures can be used to maximize the throughput of a manually operated test system. The fixture is divided into two halves with each accepting one or more PCB’s. While one side of the fixture is testing a PCB, the other half of the fixture can be manually loaded or unloaded. This innovative capabi- lity increases the throughput of the test system by overlapping the test and load times.
Included with immediate effect as a standard feature on all new 5220 Power Manufacturing Defects Analysers, existing systems can be upgraded with the Dual Vacuum Control capability. A fast analog 19 inch rack-mountable test system, the analyser combines a high 1200 components/sec test speed with the ability to accurately test a wide range of component types, effectively blurring the line between MDA, or ana- log in-circuit, and full digital in-circuit. Controlled by an industry standard PC, the test system has a small footprint allowing simple integration into automated in-line manufacturing facilities.
electronica, booth A1.117
EPP EUROPE 443
