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    Startseite/Applications/Artikel
    Low-cost test solution for high-speed ICs
    Foto: Ludovico Ceroseis / Unsplash
    Applications

    Low-cost test solution for high-speed ICs

    The Agilent Bist Assist 6.4 for the semiconductor industry is a production-test solution that enables signal integrity testing of high-speed serial links
    Veröffentlicht
    04. Oktober 2004
    Lesezeit
    1 Minute
    Rubrik
    Applications

    EPP EUROPE 447

    www.agilent.com/see/bistassist

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