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    Startseite/Technology/Artikel
    KIC Presents Data-Driven Thermal Process Control at SMTA Ciudad Juárez
    Foto: Homa Appliances / Unsplash
    Technology

    KIC Presents Data-Driven Thermal Process Control at SMTA Ciudad Juárez

    Reflow oven monitoring and process optimisation solutions on show at regional electronics manufacturing event in Mexico
    Veröffentlicht
    22. September 2026
    Lesezeit
    2 Minuten
    Rubrik
    Technology

    KIC, a specialist in thermal process monitoring and optimisation for the electronics manufacturing industry, presented its data-driven thermal process control solutions at the SMTA Ciudad Juárez Expo & Tech Forum. The event brings together EMS providers, OEMs and process engineers from the northern Mexico electronics manufacturing corridor, a region closely integrated with supply chains serving the North American market.

    KIC's portfolio centres on real-time profiling and process window optimisation for reflow soldering ovens. The company's systems collect thermal data from production boards as they pass through reflow ovens and compare the resulting profiles against process windows defined by solder paste and component specifications. Deviations are flagged automatically, enabling process engineers to make informed adjustments before out-of-spec conditions lead to soldering defects.

    A core element of KIC's offering is its PWI (Process Window Index) metric, which provides a single numeric value representing how centred a thermal profile sits within its allowable process window. A PWI below 100 indicates the profile is within specification; values approaching or exceeding 100 signal that the process is at risk. This quantitative approach supports objective process comparisons across multiple reflow ovens or production shifts, which is particularly relevant for high-volume EMS environments.

    Data-driven thermal management is increasingly relevant in the context of smart factory and MES integration. By logging profiling data continuously and linking it to board-level traceability records, manufacturers can demonstrate process compliance to customers and auditors — a requirement that has grown more stringent across automotive, medical and aerospace electronics segments. KIC's systems are designed to export data in formats compatible with factory-level traceability architectures.

    The SMTA Ciudad Juárez Expo & Tech Forum serves as a regional platform for technology exchange in an area that hosts a significant concentration of electronics assembly operations. For equipment and process technology suppliers such as KIC, regional events of this type provide direct access to process engineers responsible for day-to-day production decisions. Thermal process control remains a persistent challenge in SMT assembly, where board complexity and component density continue to increase requirements for profile precision.

    KIC's presence at the event underlines ongoing industry attention to closing the gap between reflow oven capability and actual process performance through continuous measurement rather than periodic manual profiling runs.

    Quelle: KIC – https://kicthermal.com/kic-showcases-data-driven-thermal-process-control-at-smta-ciudad-juarez-expo-tech-forum/

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