- Die placement metrology
- Wire bond
- Epoxy spread and bridging
- Lead frame integrity
- 2D and 3D high-resolution imaging
- Ball diameter, shape, offsets and damage
- Coplanarity and height measurements
- Die alignment metrology on the substrate
- Edge, FM and surface
- Flux and paste
- Dice wafer inspection including:
- Die metrology
- Die surface and edge chips
- Traceability products and image archiving





