The AOI system is searching for all kinds of defects caused by missing or excess print or layers, print shifts, scratches, shrinking, contamination, unwanted particles, holes, layer lift-offs, discoloration, etc. The system can also inspect transparent materials like adhesives and over glaze. The inspection of a 4 ” x 4 ” substrate takes about 5 seconds and is totally independent of the structures that are on the inspected device. The substrate size is practically unlimited. The AOI systems can easily be integrated into any production line.
EPP Europe 448
