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    In-line X-ray inspection – extremely fast, both sides and full-surface
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    Products

    In-line X-ray inspection – extremely fast, both sides and full-surface

    The X7058 was specially developed for an ultra-fast, in-line-capable automatic 3D X-ray inspection of electronic assemblies. With this system, the entire
    Veröffentlicht
    22. Oktober 2015
    Lesezeit
    2 Minuten
    Rubrik
    Products

    The specially developed 3D X-ray sensor technology of the new AXI system provides optimum contrasts and a superb image quality. During the 100 % top and bottom side 3D inspection, each detail of the entire electronic assembly is scanned several times by high-power line scanning cameras. The heart of the X-ray technology is the high-performance sealed microfocus X-ray tube with up to 130 kV/390 µA. The 3D reconstruction is performed on the basis of planar computed tomography. Even larger electronic assemblies, up to a printed circuit board size of 22“ x 20“ (optional 30“ length), are reliably inspected.

    The particular advantage for efficiency is the fast, reliable multi-level inspection in just one inspection process. The system features an automatic separation of top and bottom sides through the software (Placement Level Separation). Without this feature, during X-ray penetration the components on the top and bottom sides would cover each other to make reliable defect detection impossible. Thus, multilayer electronic assemblies assembled on both sides can be inspected for all typical SMD defects with reliability, in a way that is very convenient for the operating personnel.

    Thanks to the unique handling design, the X7058 is also extremely fast. The multi-chamber system and double gate ensure electronic assemblies can be moved within the system simultaneously. Handling time is reduced to a minimum. Thus, in connection with the Viscom FastFlow design, unparalleled short throughput times during inspection are achieved.

    The operating software vVision guarantees intuitive operation and simple inspection program generation. With it, the X7058 offers the same user interface as the proven Viscom AOI systems. This provides the basis for easy implementation of traceability designs. The intelligent TrueYield applications for optimum line networking and the best possible defect detection, e.g., Closed Loop, Integrated Verification, Quality Uplink or Statistical Process Control, round out the offer.

    productronica, booth A2-177

    www.viscom.com

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