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    In-line 3-D X-ray inspection with true parallel AOI/AXI
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    Applications

    In-line 3-D X-ray inspection with true parallel AOI/AXI

    Viscom sets a new standard in combined optical and X-ray inspection with a solution that manufacturers have long been waiting for – the X7056, with true
    Veröffentlicht
    04. Juni 2007
    Lesezeit
    2 Minuten
    Rubrik
    Applications

    The heart of the systems’ X-ray technology – the high-performance microfocus X-ray tube, developed and produced by the company – ensures a resolution of 15 µm per pixel. The 3-D X-ray iterative modeling also yields highly accurate image quality. Thus, complicated overlaps on printed circuit boards populated on both sides can be resolved and easy-to-analyze features generated. With the integration of 6-megapixel-sensor technology, the system offers the highest inspection depth of all the firm’s systems, at maximum throughput rates. Especially noteworthy is the fact that the system can be equipped with AOI cameras, for simultaneous inspection of both top and bottom sides of a PCB.

    With simultaneous top- and bottom-side optical inspection plus X-ray inspection, the high-performance combination system sets a new standard in quality assurance. Simultaneous inspection and double-track loading result in very rapid inspection and minimal handling times. The system is fully modular, so it can be used as a combination AOI/AXI or pure AXI system. These various inspection concepts provide the utmost in flexibility to meet customer requirements. Additional features include rapid program generation with the company’s EasyPro software and the full scope of the firm’s inspection algorithms. The system is completely hardware- and software-compatible with all AOI systems from the enterprise. An optional high-performance VPC software module controls process monitoring and optimization with a multitude of filter functions.

    www.viscom.com

    EPP Europe 441

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