Whilst the module occupies one of the TAP (Test Access Port) locations in the QuadPodT the system still offers four independent TAPs to the target UUT by offering a stream-through option. Hot swapping of targets is supported by the automatic ‘power down between tests’ feature of QuadPodT. 100 % backward compatibility with other JTAG I/O scan systems is ensured by simulation of the former DIOS-type scan devices. What’s more both output and input thresholds can be programmed to 1.5, 1.8, 2.5 or 3.3 V making them ideally suited to testing of modern low-voltage logic families. The I/O channels are grouped into blocks of 16 channels. To reduce scan chain length and improve test efficiency any number of 16-channel groups can be bypassed. Selected channels can be interfaced with custom cabling to the board under test or interfaced with bed-of-nails fixtures for higher volume production.
EPP Europe 566
