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    Flying probe test solution
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    Applications

    Flying probe test solution

    The Aerial Flying Probe test system from Seica is based on the core hardware and software of the VIVA Integrated Platform (VIP) and uses four completely
    Veröffentlicht
    12. April 2007
    Lesezeit
    2 Minuten
    Rubrik
    Applications

    As the standard electrical test, the test system uses the company’s proprietary OTPN (One Touch Per Net) technique: multi-tone signals are injected through the nets of the UUT and the results are analyzed with Fast Fourier Transforms (FFT) to characterise the net and identify faults on subsequent boards to be tested. Other tests, for example verification of junction faults, are also executed during the same OPTN. In this way test program generation is simple and immediate, fault coverage is high and throughput is maximized.

    According to the company, the test system represents a simple, immediate solution to those customers who need to implement a test strategy that is cost-effective and is very easy to program and operate, even for non-specialized personnel.

    Options include the in-circuit test and visual inspection software modules and the system is provided with data collection and statistics functions, and, since it is based on VIP technology, it is fully compatible with the Pilot Flying Probe, Strategy In-circuit and Valid Functional testers from the company.

    All of this is packed into a compact yet easy-to-load system that, depending on the model, can accommodate large boards up to 24” x 24” in size.

    SMT, hall 7, booth 247

    www.seica.com

    EPP Europe 476

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