Advantest’s M4741A dynamic test handler helps to achieve high throughput of up to 4000 devices per hour, when simultaneously handling 4 ICs. It is targeted at miniaturized devices (0.3mm) and high-density IC packages such as BGAs and CSPs. Traditional handler alignment is not adequate for the extremely small, high-density BGAs and CSPs which have narrowed to below 0.5mm, and therefore lower throughput results. The M4741A employs vision alignment and is capable of testing even 0.3mm-width devices. Its imaging features ensure that parts are accurately; then a more secure test is achieved and fewer devices become damaged during verification. The ’motorized pickup automatically adjusts its stroke and speed to prevent components from cracking and chipping. Furthermore, to reduce contact fails, it uses a pressure control mechanism that enables constant, uniform pressure with the device. As an option, temperatures from 50 to 125°C can be applied.
EPP EUROPE 442
