Zum Inhalt springen
EPP Europe
  • News
  • Products
  • Applications
  • Technology
  • Semiconductor
  • Inspection
  • Company News
  • Events
EPP Europe
  • Technology
  • Inspection (AOI/AXI)
  • Semiconductor Packaging
  • Company News
  • Products
  • Trade Shows & Events
    EPP Europe Newsletter
    The most important electronics-manufacturing news delivered to your inbox.

    Info

    • Impressum
    • Datenschutz
    • Barrierefreiheit
    • Datenschutzeinstellungen

    Kontakt zur Redaktion

    EPP EuropeKonradin Mediengruppe
    Ernst-Mey-Str. 8, 70771 Leinfelden-Echterdingen

    E-Mail: redaktion@konradin.de
    Folgen Sie uns
    EPP Europe
    © 2026 EPP Europe
    Startseite/Applications/Artikel
    Digital I/O scan test module provides flexibility
    Foto: Zulfugar Karimov / Unsplash
    Applications

    Digital I/O scan test module provides flexibility

    JTAG Technologies has introduced the JT 2111/MPV Digital I/O Scan (DIOS) module. The module retains a legacy form-factor and default settings but adds
    Veröffentlicht
    06. November 2007
    Lesezeit
    2 Minuten
    Rubrik
    Applications

    Peter van den Eijnden, JTAG Technologies’ Managing Director comments: „The JT 2111/MPV DIOS Test Module provides a ‘best-of-both-worlds’ solution when it comes to implementing boundary-scan and functional tests. For example, a target circuit board may contain elements, such as board-edge connectors and non-boundary-scan logic clusters, which cannot be accessed directly by boundary-scan. In such cases, the overall testability of the board is compromised, allowing some manufacturing faults to go undetected. The DIOS module overcomes this problem by extending the reach of boundary-scan to include the testing of circuit board edge connectors and by providing extra test points internal to the PCB to improve fault coverage.“

    In addition, the module’s hot-swap feature offers improved test throughput by allowing test targets to be connected/disconnected from the fixture without cycling power.

    100 % backward compatibility with previous versions is ensured by simulation of the former DIOS devices. What’s more both output and input thresholds can be programmed to 1.5, 1.8, 2.5 or 3.3 V making the module ideally suited to testing modern low-voltage logic families. The I/O channels are grouped into blocks of 16 channels and, to reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.

    Selected channels can be interfaced with custom cabling to the board under test (low volume apps) or interfaced with bed-of-nails fixtures for higher volume production. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals. Up to 10 JT 2111/MPV DIOS modules can be daisy-chained together to provide a massive 640 I/O channel count.

    Van den Eijnden concludes: „The JT 2111/MPV DIOS is extremely versatile and offers a low-cost and modular method for adding JTAG compliant I/O to any test strategy. Moreover, they’re manufactured and supported by the market-leading and longest-established boundary-scan company in the business.“

    Productronica, Stand A1.458

    www.jtag.com

    EPP Europe 457

    Mehr aus Applications

    Weitere aktuelle Artikel aus der Rubrik Applications.

    Alle Applications-Artikel
    Expert to highlight new solder paste in Rosemont
    Applications

    Expert to highlight new solder paste in Rosemont

    25. August 2025

    AIM Solder is participating in the upcoming SMTA International 2025 event, which is taking place from October 19–23 at the Donald E. Stephens Convention

    Selective soldering machine take production to a new level
    Applications

    Selective soldering machine take production to a new level

    27. Mai 2025

    Under the motto “Assembling the Future”, Phonotronica Ltd. has been a pioneer in the development and manufacture of electronic modules since 1990.

    ← Zurück zu ApplicationsZur Startseite