By means of a scanning device, the component’s CAD-data is read into the X-ray system and laid over the image (live CAD-Overlay). This allows the user to have the complete sample data available at all times, even when rotating and tilting the sample and during ovhm. The software platform features a sample map and CAD view, which are constantly displayed in small view on the screen, to facilitate navigation of the sample.
Another innovative feature is the height map, which displays differences in height in circuit boards caused by warping, shrinkage and strain and equalizes them automatically. The software platform was designed to offer the greatest possible ease of operation and can be controlled by either joystick or mouse control.
Also on display: The microme|x, a fully AXI-capable inspection system equipped with hard- and software for highest magnifications and maximum defect detection at minimal cost. Combining high-quality automated X-ray inspection, 2 D X-ray inspection and 3D computed tomography in one single system, the system offers exceptional value from both a technological and economical standpoint.
The 180 kV nanotom, the company’s high-performance nanoCT system offering voxel resolutions of < 0.5 µm. It is the first nanoCT system to come standard with a 180 kV nanofocus tube. Its granite-based manipulator system, digital 5 M Pixel detector and extended measurement range ensure excellent image resolution and highest magnifications.
The development of the 180 kV tube outfitted with proprietary generator technology, which is now standard for most inspection systems from the firm. Unlike 160 kV tubes, the 180 kV tube allows the inspection of even highly absorbent samples and, in combination with the company’s high-performance generator technology and 4 M Pixel (and higher) detector, provides excellent image quality and high-quality inspection results.
Productronica, Stand A2.277
EPP Europe 472
