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    Advanced System in Package (SiP) inspection and measurement system
    Foto: Laurens van der Drift / Unsplash
    Products

    Advanced System in Package (SiP) inspection and measurement system

    Mirtec shows its most recent solutions for System in Package (SiP) inspection and measurement. Brian D’Amico president of Mirtec’s North American Sales
    Veröffentlicht
    15. Juli 2016
    Lesezeit
    1 Minute
    Rubrik
    Products
    • Solder ball/bump – presence, pitch, offset, height, co-planarity and bridging
    • Bond wire – short, broken, shift and loop height
    • Chip bond – offset, height, crack and chip
    • Discrete device – presence, offset, height, co-planarity and solder fillet
    • Heat sink – presence, offset and height
    • Under-fill – presence, fillet and height
    • PCB – scratch, contamination and bridging
    • Package – warpage, crack, marking, dimensions and chipping.

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