The companys are offering the ultimate yield improvement tool, called SmartLoop, which removes the barriers to real process management in the electronics manufacturing industry. By linking the Mirtec in-line 3D AOI system with the Yxlon microfocus X-ray systems starting with the FeinFocus product line and combining them with a powerful management information system, suspect parts that cannot be fully checked in-line, like BGA, QFN etc., are automatically inspected with industry-leading technology including inclined CT for checking the hidden joint interfaces. All results, data and images are displayed on a single screen, including SPI data. This allows accurate decisions to be made based on complete detail. Additionally, by tracking trends the technician can modify acceptance limits on the 3D AOI and SPI to improve the accuracy of the inspections. All data is stored in one place, giving complete traceability and allowing trends to be monitored and reports produced. The result is ultimate yield improvement because the number of false fails and escapes can be reduced dramatically.
By combining the strengths of the market-leading in-line 3D AOI inspection system with the speed and accuracy of the at-line X-ray system, which allows hidden joint interfaces on bottom-terminated components like BGAs, CSPs, QFNs, etc. to be seen, the manufacturing process is continuously and automatically improved. “The details that the YXLON system delivers together with the MIRTEC data in one single system will, for the first time, allow the user to generate an intelligent, fact-based decision that will improve yields and reduce costs significantly,” explained Stefan Moll, President YXLON International. “As we move towards the Internet of Things within Industry 4.0, this is a major step in data integration and process management.”
“Mirtec has been in the forefront of inspection process improvement software with our Intelli-Sys and Intelli-Track software. Many of our customers already are benefiting from the reduction in required manpower and the boost to their yields,” said Chan Wha Pak, CEO, Mirtec Co., Ltd. “The cooperation with a world-leading X-ray partner and innovative software company was the natural next stage in offering our customers not just a way to catch mistakes, but to provide them with the means to stop making them.”
