Test Research Inc. (TRI) announced that its TR7600FB SII AI-Assisted 3D Automated X-ray Inspection (AXI) system has received the 2026 Mexico Technology Award in the AXI Inspection category. The award was presented on 7 October 2026 during a ceremony held ahead of SMTA Guadalajara 2026 in Jalisco, Mexico.
The TR7600FB SII is designed to handle diverse product layouts and is optimised for inspecting BGAs, multilayered structures, SiP, IC, CSP, Flip-Chip components and specialised substrates. The system's X-ray tube positioning allows close proximity to the board underside without mechanical interference, enabling high-resolution imaging of components on the top side. Supported inspection modes include 2D, 2.5D, 3D, and optional CT.
For European electronics manufacturers working with advanced packaging and densely populated boards, the recognition underlines growing industry interest in AI-assisted AXI platforms capable of addressing complex inspection challenges across substrate types and component configurations.
Quelle: Test Research (TRI) – https://www.tri.com.tw/en/news/news_detail-13-1-6--8865-1.html
