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    Teradyne announces double-sided wafer probe test
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    News

    Teradyne announces double-sided wafer probe test

    Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and
    Veröffentlicht
    07. April 2025
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    2 Minuten
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    The new test cell integrates Teradyne‘s UltraFLEXplus automated test equipment (ATE) and programming environment, IG-XL, with ficonTEC‘s advanced optical alignment, probing, and wafer handling technologies. This collaboration enables the testing of hybrid bonded PIC/EIC wafers in a production environment.

    The partnership with ficonTEC enables Teradyne to bring a production-ready system to market today, and Teradyne is committed to fostering an open ecosystem for silicon photonics and CPO testing. By ensuring that the UltraFLEXplus is compatible with industry-leading optical instrumentation, probers, alignment systems, and probe cards, Teradyne is delivering a seamless and flexible testing environment for its customers.

    Regan Mills, President, Product Test at Teradyne, commented: “Our partnership with ficonTEC enables us to deliver the first high-volume double-sided test cell for silicon photonics wafer test to meet the quickly evolving needs of the industry. Our commitment to an open ecosystem ensures our customers can choose the solution that is right for them.”

    The introduction of the double-sided wafer probe test cell is expected to have a significant impact on the silicon photonics and CPO market. By enabling high-throughput electro-optical testing of silicon photonic wafers, this solution addresses the critical need for known good die testing before wafers are diced and packaged into CPO devices or pluggable transceivers.

    The integration of Teradyne‘s UltraFLEXplus and ficonTEC‘s optical alignment and probing technologies ensures that the test cell operates efficiently within the existing fab and OSAT test floor infrastructure, providing a comprehensive and cost-effective solution.

    “FiconTEC is proud to partner with Teradyne to pioneer this innovative solution for the rapidly developing market. Our joint effort uniquely combines the class-leading capability of both companies, delivering a high-throughput, cost-effective test solution for silicon photonics and CPO manufacturing workflows,” added Stefano Concezzi, Corporate Vice President at ficonTEC.

    https://www.teradyne.com

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