According to the company, the new Takaya APT-1600FD-SL is a new larger test area version of its double-sided system which was introduced to the market a few years ago. “There has been much demand for this 25” by 24” test area double-sided system especially from users who manufacture boards such as semiconductor test system probe cards which can be quite large and require access points to both sides of the board at the same time in order to verify continuity,” the company said. “The APT-1600FD-SL deploys the flying probes to both sides of a UUT. This dual-sided probing contact contributes to a marked increase in test coverage and also ensures the shortest amount of test time.”
“The new APT-1400F-SL-A is an inline/automated version of the extremely popular single-sided flying probe system APT-1400F-SL. This new version allows the system to be used in an automated environment either by putting the system in-line at the end of the manufacturing process or setting up an automated island by integrating the system with board loaders, unloaders, and buffers allowing the systems to do batch testing in an ‘operator-less’ environment.”
Booth #1401, IPC APEX 2022