The company’s premier flying probe test solution, the Pilot VX, will be on display with a revamped, modern design platform, with unique options like the FlyPod and FlyStrain and the optimized VIVA software management, is the gold standard in terms of flying probe speed and performance and is a powerful asset, deployable in every phase of today’s accelerated product lifecycle. The PILOT VX is fully automated and its state-of-the-art mechanical architecture and proprietary motion controllers enable reduction of up to 50% in test time. 12 multi-function test heads provide the capability for double-side probing of up to 44 points simultaneously and a technologically advanced measurement hardware, with the capability to power the board (up to 2A per probe) via all of the 8 standard electrical probes, and a new microwave-based measurement technique provide unrivaled test performance. This is combined with a next generation of LED sensors combining visible and infrared sensors in a single all-in-one unit, or a 750+ MHz flying oscilloscope to break new limits in high frequency applications. The VIVA software platform saves even more time by enabling the parallelization of different types of tests, and smart analysis capabilities based on the principles of artificial intelligence can automatically optimize the test flow in run-time.
Visitors will also see two new solutions, the latest additions to Seica’s Valid platform, renowned for high-performance in-circuit and functional test via a bed-of-nails or fixed, industry-standard receiver.
The Valid SL will be on display in a fully automated PCBA production line, with Seica Automation loading/unloading modules, label applicator, and conveyors. The design allows for easy integration into high-volume production environments, offering flexibility, cost savings, and increased productivity. Its cableless architecture ensures optimum integrity and reliability as well as long-term maintenance, and it is equipped with new 128-channel scanner cards, enabling configurations of over 4,400 channels, ideal for the most complex test requirements. The expanded standard test area can be configured as a single-stage or dual-stage system, and its multi-job architecture, supported by the new version of VIVA software, which includes a new operator interface, improves usability for both programmers and operators. Easy access to the system‘s internal hardware modules ensures excellent ergonomics making maintenance operations simple and efficient.
The Valid LR on display is the latest generation the company’s platform and is designed to include the capabilities needed to replace obsolete legacy systems, allowing customers to ensure continuity of established test processes by providing full test program compatibility. Seica has extensive experience in providing legacy replacement solutions, having replaced numerous brands of legacy test systems, enabling customers to maintain long-term logistics support at competitive costs. The native multi-resource architecture of the Valid LR gives it the flexibility and performance required for the seamless migration of existing test programs and fixtures, combining the capability to support older technologies with high performance, state-of-the-art tools, which are then also available for the development of new test programs. Furthermore, the solution is engineered for high scalability and performance, with an innovative, cableless architecture, supporting up to 5888 channels with a 1:8 digital multiplexer. It offers up to 24 programmable power supplies, ensuring flexible management of power-on tests. The intuitive, customizable operator interface is built on a PLC system with OPC-UA communication for seamless integration into modern test environments.
The company will exhibit a range of further innovations, including the new S20 line that includes two solutions dedicated to the testing of power semiconductors. The S20 IS³ offers a cutting-edge solution for testing discrete power devices, including SiC and GaN technologies, whereas the S20 RTH test system is designed to deliver precise thermal resistance (RTH) characterization with advanced power and cooling management capabilities. In modern power supply design, increased attention is given to the electrical efficiency of the overall system and to the junction temperature of semiconductor devices, and this kind of test evaluates the thermal stress on power MOSFET devices when they are used in switch mode power supplies. By this computation and with the physical characteristics of the device, it is possible to predict the temperature reached inside the junction, and the allowable margin or heatsink required to assure that the system has a suitable thermal margin during operation. This approach is fundamental because correct computation allows for a more accurate evaluation of component/device lifetime and assures working operation within the Safe Operating Area.
Both the S20 IS³ and S20 RTH communicate and send all test measurements and binning data via industry wide standards, and Seica’s extensive software capabilities allow the integration of the unique requirements of the end user.
All of the solutions on display include the company’s VIVA software platform, which is able to provide intelligent integration with all aspects of the customer’s manufacturing processes. VIVA also leverages AI to enhance fault detection and suggest more advanced technical solutions during electronic board and module testing, increasing diagnostic accuracy and overall test efficiency.
Combining mechanical and electronic innovation, software intelligence, and scalable implementation models, the company enables its customers to achieve maximum productivity, precision, and operational visibility, all while celebrating four decades of leadership and technological innovation.
The trade fair is taking place in Munich, Germany, from November 18–21, and Seica’s experts will be welcoming industry professionals at Booth A1–538.
