One of only a few laboratories in Germany, HTV provides results for layer thickness measurements with X-ray fluorescence analysis (XRF), which are internationally accepted and globally comparable, HTV said in a press release.
Layer thickness measurements on metals using the X-ray fluorescence method are performed in accordance with DIN EN ISO 3497:2001–12.
“In our own Institute for material analysis we use state-of-the-art equipment and various methods to perform quality control during production, i.e. failure analyses, counterfeit screenings or qualification of electronic components.
“Layer thickness measurements via XRF allow for instance a fast and non-destructive examination of soldering surfaces on PCBs, corrosion protection layers, chromate coatings, hard gold plating on connectors or layer thicknesses of a PCB finish,” the company explained.
