Products
The company will present two new options for its MPT3000 platform, adding to the range of SSD protocols and form factors that it supports. The new MPT3000HES leverages the same hardware, software, thermal performance and interfaces used throughout the series, but in a smaller configuration designed for “copy exactly” engineering and lower-volume applications. In addition, the new Smart Power option is a cost-effective solution for built-in self-test needs, including production test insertions in which a low-speed serial interface can provide maximum synergy with protocol test insertions.
The company’s exhibit will also feature a digital display and laptop demonstration of the cost-efficient T5851 tester for universal flash storage (UFS) devices and PCIe BGA memories.
Paper Presentations
The company will make two presentations at the summit during Session 201-C on Testing Issues, which begins at 8:30 a.m. on Wednesday, August 9. Vishal Devadiya will address “Preparing SSDs for Qualification Testing” and Ben Rogel Favila will discuss “A Scalable Platform for Optimal SSD Test.”
