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    Accuracy and harvest no clashing targets
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    News

    Accuracy and harvest no clashing targets

    Quality and reliability of their products is a major objective for all manufacturers of board assemblies. The potential cost in rework and loss of
    Veröffentlicht
    24. September 2003
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    10 Minuten
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    Thorsten Niermeyer, Agilent Technologies

    Testing has always had a major role to play on the shop floor, and not only as a sorter of good products from bad. Electrical test and inspection (the verification tools) provide the means to continually monitor process quality and to provide the feedback necessary to constantly optimize the manufacturing process parameters. As technology becomes more complex, electronics packaging become ever tighter as product density continues to escalate, the verification challenge increases. And, in particular, how to achieve the test accuracy required maximizing product reliability without compromising the throughput needed for high-volume production?

    Automated optical inspection (AOI) is the primary in-line verification method used in high-volume manufacturing. In such applications, the throughput of the AOI equipment has to keep pace with the rest of the manufacturing equipment in order to achieve a balanced production flow. At the same time, the accuracy of the inspection has to be such as to minimize the probability of either a good board being declared bad or a bad board being declared good (false calls). For AOI, this accuracy is often referred to as the call accuracy.

    This is a recurring problem in all methods of test and verification: thresholds have to be optimally set in order to balance the probability of either situation occurring. Conventionally, those thresholds are set to ensure that the chance of passing a bad board is at an absolute minimum. This is done to minimize failures in the field and so minimize the costs of maintaining quality and reliability. However, this strategy can increase the chance of good boards being failed during manufacture, the so-called false failures. False calls also involve penalties, the time of a repair technician to determine whether a declared fault is true and possibly unnecessary rework. The accuracy of a verification system has a direct and potentially very significant impact on the overall cost of the manufacturing process.

    AOI systems use imaging techniques to examine the structure of a board assembly. Optical inspection involves capturing images of a device or feature (e.g. solder joint) on a board and then making a determination of whether the device or feature is correct. Depending upon this decision, the AOI system may declare, for example, a miss-ing device, reversed polarity device, solder bridge or suspect solder joint. There are two fundamental aspects to this determination: one is the image capture and the other is the analysis to produce a decision. Both of these affect the ultimate accuracy that can be achieved with an AOI system.

    Over the development of AOI there have been many efforts made to refine the imaging system by varying the configuration of the lighting system or the camera. Typically, these have involved either using different angles of illumination and an orthogonal positioned camera, or moving the camera position to slightly ”off-angle” (around 200 from vertical) and using orthogonal lighting. The geometry of optics suggests that the most information from an object (say a solder joint) can be captured when the angle of illumination is close to 90° from that of the camera. This is the reason why the majority of AOI systems use an orthogonal positioned camera and some form of domed lighting to illuminate the board from low angles (around 600 from the vertical is possible). This law of optics is slightly at odds with the ”intuition” of most people who first look at AOI systems and think that moving the camera to an off-angle would give a better view of solder joints. In addition, of course, the continuing developments in imaging technology with the increased resolution of megapixel digital cameras have greatly benefited the AOI industry.

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    By using different configurations of light source and camera, many views of the target can be captured which can provide greater accuracy in the subsequent analysis. Unfortunately, capturing more images takes more time and this can directly affect the throughput of the equipment. Accuracy and throughput can therefore be considered conflicting demands, and the AOI designer has to create innovative solutions in order to achieve the optimum call accuracy without compromising the throughput.

    Once the images are captured, it has to be determined whether or not there is a fault. There are currently three major algorithm types used: correlation, feature extraction and geometric pattern matching. All have advantages and disadvantages, summarized in the table. AOI systems use either one or, in some cases such as the Agilent SJ50, a combination of these techniques, to maximize the call accuracy.

    In the more than ten years that AOI systems have been used in SMT manufacturing verification, all of the developments in imaging and algorithms have been incremental. Fundamentally, the techniques used today are the same as those used in the original equipment. All current systems share one basic and fundamental characteristic. The inspection system produces images in two dimensions only, and this ultimately limits the accuracy of inspection and repair that is possible. Moving to a solid shape 3D visualization model (SSM) is the breakthrough that is needed to move AOI to the next stage of its development.

    Agilent with its solid shape modeling (SSM) technique is the first company to offer this capability in an AOI system. This modeling produces a lifelike 3D visualization of features and components that revolutionizes the effectiveness of AOI systems. When inspecting, it can lead to greater call accuracy, and at the repair station it gives the operator enhanced capabilities to examine a suspect feature in detail in order to confirm the nature of the fault.

    SSM utilizes multiple angles imaging to produce its realistic 3D visualization. A technique that has been refined by the Agilent laboratories specifically for application in AOI systems. With a patent pending on the technique, it can truly be described as a breakthrough in AOI. The SJ50 Series II uses an orthogonal placed camera with segmented rings of color lighting. The system has the ability to turn various segments of the lighting rings on and off, and so light the object from different angles. The different segments and angles are pre-programmed into the system. The segments are used to light the device from north, south, east and west and then from four higher angles. Eight images of every device are necessary in order to create a SSM 3-dimensional visualization. The light sources are red, green and blue allowing a full color image to be created. As well as 3D, color is an excellent addition to AOI since it can help differentiate between dark devices on dark colored boards and also in bright inspection environments, and produce color contour maps of solder joints for better fault determination.

    With SSM technique, the lighting head captures eight images of each device using the segmented lighting control. These images are combined to form a composite color image. This image is then passed to the patented software reconstruction mechanism. The result of the reconstruction procedure is a lifelike 3D visualization of the object or a board feature. The design of the system is such that the multiple images can be captured with no impact on the general throughput.

    The images show the effectiveness of this reconstruction. In figure 1, an SSM-produced image is compared to a normal 2D AOI image. In the 2D gray-scale image, it is very difficult to tell if the left-most joints on the SOIC are good; this is difficult for both the AOI system inspecting the image and the repair technician who has to verify this defect. In comparison, the SSM-generated image gives much more detail. It is obvious that the two left-most pins have insufficient solder, and therefore must be considered suspect solder joints. This helps the AOI system using the SSM method in achieving good call accuracy and the operator confirming the result.

    Figure 2 shows another example of the image quality achieved with SSM technology. The detail of a solder joint is not available from any other source except perhaps an off-line operated microscope. Using SSM-based inspection, the repair operator has the ability to rotate the image to any angle for more detailed inspection simply by using the mouse, exactly as the user would look at a solder joint with an off-line microscope.

    Figure 3 shows a dimple polarity mark reconstructed by the SSM procedure. The resolution is very fine, reproducing a precise model of the dimple. Using this image, the repair staff will have no doubt about the presence of the polarity mark, even on a small dark SOIC.

    Figure 4 shows examples of common faults using SSM-visualization technology. The solder bridge can be seen in the very clear 3-dimensional views. On the billboard/tombstoning image, the detail of the solder shape and quality can be clearly seen.

    These examples underline the advantages of lifelike 3-dimensional visualization technology when applied to the AOI environment. The 3D images maximize call accuracy during inspection and facilitate fault determination for repair. Providing these capabilities with no penalty to inspection throughput, AOI is moved to its next stage of development, helping manufacturers meet the demands of their clients for ever more reliable products.

    www.agilent.com

    In der Röntgeninspektion hat man bereits seit einiger Zeit die Möglichkeit genutzt, dreidimensionale Darstellungen per Computerhilfe zu erzeugen. Nun ist die Reihe auch an AOI, der optischen Inspektion, hier mit einem Modellingsystem, das aus verschiedenen Bildern, die mit unterschiedlichen Winkeln aufgenommen wurden, realistische 3D-Darstellungen erzeugt. Agilent hat bei seinem jetzt vorgestellten SSM (Solid Shape Modeling) auch gleich als weiteres Inspektionskriterium noch Farbe mit ins Spiel gebracht. Reduzierung der Inspektionsleistung soll nicht zu erwarten sein. Die Vorteile der SSM-Technik in der Anwendung: bessere Erkennung auch in kritischen Fällen, weniger Fehlerschlupf bzw. reduzierte Zahl von so genannten Fals Calls, also irrtümlich angezeigten Fehlern, die gar keine sind, und somit eine bessere Erkennung tatsächlicher Defekte.

    Dans l’inspection par rayons X, on utilise depuis un certain temps la possibilité de créer des représentations en trois dimensions à l’aide d’un ordinateur. C’est maintenant le tour de l’AOI, l’inspection optique, ici avec un système de modélisation qui crée, à partir d’images prises sous différents angles, des représentations réalistes en trois dimensions. Avec son SSM (Solid Shape Modeling), qui vient d’être présenté, Agilent utilise également la couleur comme critère supplémentaire d’inspection. Aucune réduction de la capacité d’inspection ne serait à craindre. Les avantages de la technique SSM résident dans une meilleure reconnaissance, également dans les cas critiques, une diminution des erreurs, une réduction du nombre de ”false calls”, c’est à dire de défauts signalés par erreur, donc une meilleure reconnaissance des défauts réels.

    Nella radioscopia già da un po’ di tempo è stata sfruttata la possibilità di creare rappresentazioni tridimensionali con l’applicazione del computer. Adesso tocca anche alla AOI, l’ispezione ottica, qui con un sistema modello, che da diverse immagini riprese da diversi angoli è capace di creare delle rappresentazioni tridimensionali realistiche. La Agilent con il suo SSM (Solid Shape Modeling) recentemente presentato, come secondo criterio di ispezione ha subito completato il gioco dei colori. Non dovrebbero essere attendibili alcune riduzioni del rendimento d’ispezione. I vantaggi della tecnica SSM nell’applicazione pratica: migliore riconoscimento anche in casi critici, meno errori nascosti ovvero numero ridotto dei cosiddetti Fals Calls, vale a dire errori falsi erroneamente indicati, che non sono errori reali, e con ciò una migliore individuazione dei difetti reali.

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