ViTrox Technologies highlighted the V810 X-Ray inspection system with the new Phase Shift Profileometry, a patented technology of the company for warpage compensation and 100 percent through-hole component PCBs. Additionally, to serve market demands for small scale component inspection, the V810 is now equipped with variable magnification at 11 and 19 micros to provide end-users with better magnified images and resolution on small components such as 01005s and .2mm CSPs. The system is the latest revolution in X-ray technology inspecting double-sided panels with high defect coverage, high inspection speed and an excellent call rate. It is designed for in-line and offline use and works on both lead and lead-free solder joints. The V810’s state-of-the-art technology is based on digital tomosynthesis methodology and runs on a new platform with Windows 7 Professional 64bit. On display, the new generation V510 G2 Series AOI system offers greater performance for faster inspection with inspection speeds up to 55cm2/sec for post-reflow and 65cm2/sec for pre-reflow. The system features low power consumption with a brilliant LED monitor display and improved ergonomic adjustment to increase viewing comfort (sit-stand operation). The new multi-shot imaging technology enables the system to capture up to 180 frames per second and the multi-core processing technology significantly enhances inspection time. Additionally, the monochrome color camera via solid state modeling technologies enables best-in-class color inspection.
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