Takaya has announced the release of a dual-sided flying probe test system to accommodate large PCBAs for the emerging markets of 5G communications and BMS (Battery Management System) applications. The new system, known as the APT-1600FD-SL, provides a 48% larger test area. The company said customers, including semiconductor test probe card manufacturers, urged Takaya to increase the test area of their dual-sided system.
“Our customers spoke, and we listened,” said Takaya Group Manager Roy McKenzie said. “Their boards are very large, and simultaneous probing on both sides of the board is required to verify continuity of this complex circuitry. We responded, adding the capability that they wanted to achieve faster, more efficient testing.”
According to the company, the new tester deploys the flying probes to both sides of a UUT which contributes to a marked increase in test coverage and ensures the shortest test time. It also provides average head-speed increases of up to 50% with throughput improvements of 30–50% over existing models.
The system also incorporates a new 10-flying-Z-axis design, including 4 vertical flying probes that provide unequalled access to test points where conventional angled probes fail to contact.
Takaya says its “soft touch” probing also virtually eliminates the presence of witness marks often associated with flying probe test. To help compensate for board warpage, the system now comes equipped with a laser profiling system. “Prior to testing a PCBA, the surface of the board is scanned and the system automatically compensates for any warpage, guaranteeing maximum probing accuracy.” the company said.
The APT-1600FD series is equipped with new vision test system TOS-7F corresponding to color images as standard on both top and bottom side. According to Takaya, this system’s megapixel color digital camera and the ring illuminations with high-intensity white LED can import sharp color image to detect missing, wrong orientation and positioning error on the spot.
Next generation, high-precision measurement electronics are embedded in the flying heads allowing for greatly improved measurement accuracy and increased functional capabilities. The new measurement system includes multiple 4-quadrant source and measurement units, plus an AC sine and square wave generator and frequency counter, providing the ability to perform dynamic characteristic tests of components and circuits.
An Enhanced Function Scanner Board and communications software make it easy to connect external instrumentation for additional functional-test capabilities.