Homepage » Technology » Products »

RoodMicrotec embraces Jenoptik technology to offer wafer level PIC testing

PIC testing
RoodMicrotec embraces Jenoptik technology to offer wafer level PIC testing

Semiconductor supply and quality services provider RoodMicrotec has announed that it uses optical technologies specialist Jenoptik’s UFO Probe Card technology for its PIC wafer level testing.

“Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the test ecosystem is still under development,” the company explained. “Jenoptik provides an essential component for novel PIC wafer level tests with the opto-electronic UFO Probe Card. RoodMicrotec benefits from a fast and simple integration, high flexibility, and state-of-the-art test technology.”

“In line with an increasing demand for photonic solutions in the semiconductor sector, the requirements for corresponding ecosystems for opto-electronic components are rising and thus, not only semiconductor manufacturers with their own supply chain must change their thinking. In addition to the existing test infrastructure for electrical components, also infrastructures for photonic component testing are required. Test houses offering services such as wafer level testing for fabless manufacturers face the challenge of expanding or reimagine their test solutions towards photonic integrated circuits (PICs).”

In addition to the established tests for ICs, RoodMicrotec says it now offers a test service for wafer level photonic integrated circuits (PIC) testing to customers from the semiconductor industry. Jenoptik provides the necessary technology platform with the UFO Probe Card and thus supports RoodMicrotec in setting up the respective test structure.

“The solution from Jenoptik enables the testing of electrical and optical components with only one probe card – in parallel, not sequentially as with previous solutions. Thus, wafer level tests can be performed in a more timesaving manner and the throughput is significantly increased. As a Plug & Play solution, the hybrid probe card can be integrated directly and without much of an adaption effort into RoodMicrotec’s existing standard IC wafer probers. The existing infrastructure can be used immediately, thus simplifying the conversion of test procedures from the classic probe card for electrical components to the hybrid probe card within the manufacturing process.”

“The card does not require active alignment of the optical interfaces for every single chip. This reduces the test time and cost for each chip and … several chips can also be tested in parallel. Thus, the time needed to separate good from bad components is considerably lower if already done during PIC wafer level testing and the overall yield can be significantly improved, since only functioning chips are transferred to further manufacturing processes. Customers benefit from fewer rejects and thus reduced costs.”

“As an innovative technology platform, the UFO Probe Card offers the necessary flexibility and scalability. This enables test service providers like us to respond quickly and easily to new challenges in the market,“ said Jan de Koning Gans, Managing Director of RoodMicrotec GmbH.“We are pleased to have RoodMicrotec as a strong and experienced partner for test services, and as a supply chain specialist and service provider for the semiconductor industry it also has access to a wide range of applications. It is important for Jenoptik to recognize the different needs of the end customers in order to promote relevant further developments at an early stage,“ says Tobias Gnausch, Product Manager for the UFO Probe Card in Jenoptik‘s Light & Optics Division.

For the future, both companies plan to create standards to enable wafer level PIC testing to become even more efficient and cost-effective. “With the jointly created solutions, our customers can take the step towards the future and increasingly rely on photonic solutions.,” the company added.

www.roodmicrotec.com

Current Issue
Titelbild EPP EUROPE Electronics Production and Test 11
Issue
11.2023
READ
Newsletter

Subscribe to our newsletter now

Webinars & Webcasts

First hand technical knowledge

Whitepapers

Find all current Whitepapers here

Videos

Find all current videos here


Industrie.de Infoservice
Vielen Dank für Ihre Bestellung!
Sie erhalten in Kürze eine Bestätigung per E-Mail.
Von Ihnen ausgesucht:
Weitere Informationen gewünscht?
Einfach neue Dokumente auswählen
und zuletzt Adresse eingeben.
Wie funktioniert der Industrie.de Infoservice?
Zur Hilfeseite »
Ihre Adresse:














Die Konradin Verlag Robert Kohlhammer GmbH erhebt, verarbeitet und nutzt die Daten, die der Nutzer bei der Registrierung zum Industrie.de Infoservice freiwillig zur Verfügung stellt, zum Zwecke der Erfüllung dieses Nutzungsverhältnisses. Der Nutzer erhält damit Zugang zu den Dokumenten des Industrie.de Infoservice.
AGB
datenschutz-online@konradin.de