The photovoltaic sector is currently a booming market, investing its competence in the research and development of efficient production facilities for manufacturing of solar cells. Based on the output the evaluation and the classification respectively play an essential role in a commercial sense. If, for example, high-performance solar cells are classified a couple of categories lower, it would lead to enormous financial losses. The equipment for evaluation of measuring data consequently plays an important role along the production chain.
A small and apparently insignificant part in the expensive equipment is the test pin, which is responsible for contacting the solar cell within the cell tester. It may just cost only a couple of cents, but its uncompromising quality is crucial and decisive for the result. The measurement is accomplished according to the 4-pole-principle, in which current and voltage measurement takes place at close measuring points. Contact beams, containing insulated and wired spring contact probes are used for this purpose. The quality of the probe has a direct influence on determining the efficiency characteristic and on classification of the solar cell.
Feinmetall has developed the selectively controllable spring contact probe F815 in collaboration with the Research Centre Jülich. Its constructive design enables the 4-pole-measurement technology according to various strategies. Due to its integrated pneumatic actuator the F815 offers the advantage of contacting in solar cells or modules without movement of the test device and even with limited space. This makes the F815 ideal for contacting of thin silicon wafers with rear sided contacts, thin film solar cells and in the application of sensor technology.
The advantages at a glance:
- Pneumatically powered spring contact probe
- Simple design of the measuring system
- Contacting in applications with limited space
- Selectively controllable
- Reduction of measuring errors
- 4-pole-measurement (Kelvin-principle)
- Internal and external contacts can be moved independent of each other
- Selectively controllable spring contact probes minimises the impact of the total force on the DUT
The pneumatically powered spring contact probes from Feinmetall do not need any movable fixture frames. A small pneumatic cylinder moves the contact probe with precise timing. Inactive mass must not be accelerated anymore. This feature reduces the subsequent spring forces, thereby minimising the risk of damage. The selective individual control allows the test of different wafer formats without having to change the contact beam. The company delivers the complete set of accessories for the connection and installation of this spring contact probe on demand. Also tailor-made customer specific solutions are realised in the company-owned test fixture department.
electronica, booth A1.404
EPP Europe 434
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