Solderstar announces its new and improved range of products redefining process control measurement for conventional wave solder, mini-wave and multi-wave selective processes. This solution is built around a single data logger platform, married with a range of specialised test fixtures to capture all key parameters from all wave processes in a single pass. The MultiWave PRO is the latest product in the range, a compact and flexible instrument allowing dedicated test fixtures to be produced quickly and cost effectively for multi-wave soldering machines. Measurement sensors are fitted to customer specific locations which correspond to the soldering areas within the multi-wave solder pot tooling, this technique provides contact time and difference data to quickly allow engineers to identify any problem areas within the tool design.
The WaveShuttle Selective is a dedicated fixture for mini-wave selective soldering machines. The product provides a ten-fold improvement in measurement accuracy compared with thermocouple based systems. The product uses specially designed sensors to allow measurement of X and Y speed, contact time for both single or dual nozzle machines plus all key temperature parameters. For conventional wave solder, the WaveShuttle PRO continues to lead as the most complete tool for analysis of traditional wave solder machines. This specialised fixture is designed for the rigours of production life; featuring a 10mm base pallet and titanium side rails ensures this instrument will stand the tests of time. Titanium contact sensors and thermocouples are combined to provide temperature profile information, contact time, immersion depth, conveyor speed and parallelism measurements in one simple pass. All SolderStar wave solder test fixtures are available in custom sizes to meet the needs of customer production lines. A full range of software tools are provided with the systems to quickly capture and analyse the wave solder process. SPC features allow direct generation of XBar and Range charts, plus CPk and Cp values from the data captured by the instruments.
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