Seica SpA, supplier of automatic test systems and production solutions showcased new systems at SMT 2013. Like all of the companies solutions, the Compact Line software and hardware are based on the core proprietary VIP platform that can be specialized for multiple applications. It includes systems dedicated to in-circuit test, on-board programming of digital devices, functional and end-of-line board testing (EOL), with the possibility of having a manual or fully automated UUT loading/downloading system. The solutions find one of the major application in the automotive industry, supporting the customer in reaching the best quality targets. In addition, visitors were able to view a wide range of application solutions on the different systems, including test fixtures and programs implemented in Seica proprietary VIVA software and/or NI Labview/TestStand environment, which is 100% compatible with the Compact systems’ hardware architecture. This was a unique opportunity for a closer look and a hands-on experience of Seica’s capabilities of specializing ATE according to the client requirements, while maintaining the compatibility of fixtures and programs across the entire system range. The Compact line is fully compliant with lean production guidelines typical of the WCM standard, widely used in different sectors of today’s global industrial production environments.
The Pilot V8 is an innovative technology that offers maximum performance in regards to high test speed, increasing test coverage while maintaining an important level of flexibility. The system’s vertical architecture is the optimum solution for probing both sides of the UUT simultaneously. This feature guarantees fast, precise, reliable and repeatable probing; it also allows for full availability of all the mobile resources for testing the UUT. Foot print reduction is an additional benefit that the system can offer. The system is equipped with 8 electrical flying test probes (4 on each side), 2 Openfix flying probes (1 on each side) and 2 high definition cameras (1 on each side to allow inspection of the smallest components), and 2 power probes (1 on each side) for a total of 14 mobile resources available to test the UUT. The mobile power probes enable power up of the UUT without requiring any additional fixed cables, allowing easy implementation of functional test. The system with its ability for dual sided probing and advanced software tools allow it to be used in the repair environment to help bring your faulty boards back into the supply chain and also quickly help diagnose boards coming back from the field. In addition, the ‘reverse engineering’ capability allows for the easy schematic generation of boards that are missing CAD, schematics, and net lists.
Seica has created the Mini Line Systems, ATE suitable to implement and manage different stages of test such as; In-circuit test, Functional test, on-board programming and Boundary-Scan test. The 19” standard chassis rack architecture enables the use in a stand-alone configuration, but also an easy integration in existing cabinets or structures. All the test resources are available via connectors, which makes it extremely easy to interface with any type of fixture receiver. The company, with over 26 years of experience has created a wide range of modules, and today its expertise is fully deployed in the testers of Mini line which makes the concept of “open system” extensively available both from the hardware and software perspective. All the system resources are equipped with drivers enabling their control via off-the-shelf software such as, LabView, TestStand, Visual Basic, and Seica Viva. The on-board programming can be performed both with a universal module of the company and by managing off-the-shelf programmers. In addition, boundary-scan tests can be executed while cameras can be managed for the most varied automated optical inspection requirements. The line consists of 2 systems, Mini 80 and Mini 200, featured by a different scalability, but can be equally configured and used in the different applications.
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