Overwhelmingly, electronic manufacturers are seeking solutions to the end-of-line test bottlenecks that appear on high-volume product lines, where assembly beat rates are now faster than test rates. In addition, manufacturing engineering teams require techniques that can maintain test coverage and not increase the unit cost of test. The MTS500 flying probe tester Condor from Digitaltest captivates users with its remarkable versatility and flexibility. Apart from traditional ICT test routines, the system is also capable of performing functional tests. Tests of prototype boards and small batches are streamlined and cost-effective. Combining the flying prober with boundary scan, the benefits of both methods sum up to build a powerful test solution. Besides the classical in-circuit-test using four flying probes, functional tests using up to 1,012 fixed probes accessing from the bottom side are possible. These fixed probes can access the UUT using a simple magnetic probe bed or a ‘simple yet sophisticated’ vacuum operated adaptor solution. This solution is unique to the tester and offers a totally new usability for small production batches up to high volume. Parallel testing is now possible. While the classic flying probe test runs on a certain area of the machine, another process, like functional test or memory programming can run in parallel at the same time. This offers a new dimension of throughput, test coverage and effectiveness. Combining both flying probe and boundary scan test methods, the flying test nails can be used as virtual boundary scan cells to raise boundary scan test coverage. On the other hand, functional test coverage can be raised, as various A/D- and D/A-converter tests are possible with very little effort.
productronica, A1.365
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