Steadily increasing requirements for quality solar cells demand fast and effective characterization systems. The S2012PV is Viscom’s first dedicated optical inspection system for solar cell production. It is an AOI system for application such as wafer material inspection, cell characterization and final cell control. In the process, geometry, cracks, color, print image and micro cracks are inspected – with especially high inspection depth. The modular system comes equipped with high performance VisCam camera technology and can be adapted to every inspection stage and for each characterization task. It guarantees consistently excellent quality in cell production. The AOI system is easy to integrate into the production environment. The specially developed calibration concept ensures genuine measurement accuracy and sustained reproducibility for all inspection tasks.
electronica, booth A1.217
EPP Europe 436
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