At SMT 2008 Viscom presented the X7056 with an even faster inspection speed. The inspection system with its reportedly worldwide unique inspection solution carries out both AOI and AXI simultaneously. As a result, even hidden defects can be reliably detected – with a large inspection depth and maximum throughput. The system is equipped with the proprietary high-performance microfocus X-ray tube, which ensures a resolution of up to 8 µm/pixel in the X-ray area. But that’s not all: The inspection system shines with a positioning accuracy, which enables high-precision 3-D X-ray evaluations. Due to the integration of the optical 8 M camera technology, the system offers the high inspection depth of the AOI systems at comparable throughput. With the flexible OnDemandHR function the AOI resolution can be switched from 23.4 to 11.7 µm/pixel with the full image field size for any analysis. In addition, the inspection system provides a color evaluation. With its simultaneous optical and X-ray inspection, the high-performance combined system sets new standards in quality assurance. This combined inspection and the new axis system achieve extremely fast inspection times and short PCB handling times. The system is completely modular and can be used as a combined system or as a pure AXI system. These different inspection concepts can be flexibly implemented depending on the customer’s requirements.
EPP Europe 447
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