Advantest Europe announced availability of its new T5385 memory test system for DRAM wafer test, offering a parallel test capability of 768 devices. Furthermore, with 533 Mbps capability, the T5385 delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for tomorrow’s LPDDR2 (Low Power DDR2) and DDR3 multi-die and stacked devices. DRAM memory chips used in today’s computers and other electronics deliver faster processing speeds, higher data storage volumes, and more efficient power consumption than previous generation devices, at progressively lower prices. To enable these gains, the semiconductor industry is aggressively migrating to smaller process nodes that allow more chips and greater densities to be produced from each wafer. Throughput has therefore become a critical issue in DRAM wafer test, with chipmakers demanding significant gains to increase productivity. Advantest’s new T5385 delivers an unrivalled parallel test capability and flexible pin configurations that significantly improve throughput in the wafer test process.
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