The T 5782 memory tester from Advantest (Europe) GmbH is designed with per-site architecture and industry-leading speeds of 266 MHz/533 Mbps, and is ideally suited for testing today’s flash memories, as well as future device generations including memory-embedded microcontrollers and rapidly evolving memory bus environments. The T5782’s at-speed, at-specification performance meets the requirements of tomorrow’s Known Good Die (KGD) and MCP memory solutions. The system boasts an ability to simultaneously test up to 256 devices and inherits the advanced technologies and performance features of its predecessor, the T 5781, with a footprint half the size. The T 5782 also incorporates many flash functions including ECC and Block Management, which enable the system to flexibly address diversified needs. From refrigerators and washing-machines, to cellular phones, gaming, HDTV and cars, consumer products now incorporate an unprecedented amount of advanced technologies. Embedded flash-memory-based MCUs are dominating new system designs, true even in high-volume production because of flash memory’s improved performance, flexibility and ability to be reprogrammed. Improved performance, life, and reliability have all been pivotal to the success of flash MCU’s. For applications including computer peripherals, home appliances, and automotive uses, embedded flash is replacing ROM and one-time-programming (OTP) solutions by meeting the long-term stability and cost goals set by these well established technologies.
EPP Europe 563
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